Field Timing and Synchronization Measurement Module for the VIAVI MTS-5800

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The preferred tool for installing and maintaining networks with stringent timing and synchronization requirements.

Together with the VIAVI MTS-5800 family, the field-optimized TEM Timing Module (TEM) delivers industry-leading accuracy to field portable timing and synchronisation measurements.

The TEM features a GNSS antenna and a miniature atomic clock (MAC) to ensure nanosecondaccurate measurements even when a satellite signal is not present and the module is running in holdover.

With a MTS 5800 and a TEM, you can:

• Perform one-way delay measurements that help you root out asymmetric network delays
• Precisely measure PTP one-way delay, constant time error (cTE), dynamic time error (dTE) using wander analysis with ITU masks and maximum time error max
• Measure Floor Packet Percentile (FPP) of the Sync PDV packets to ensure PTP PDV is within limits for recovering frequency
• Qualify GNSS antenna installations by evaluating satellite signal strength and viewing 360° sky plot either instantly or over a 24 hour period
• Troubleshoot the accuracy of equipment 1 PPS output signals with 1 PPS wander analysis
• Measure T1 and E1 jitter and wander
• Measure PTP Frequency accuracy using a Floor Package Percentile (FPP) analysis

Key Features

• Performs 1588v2 (PTP) measurements including nanosecond-accurate PDV and time error (TE) measurements
• Verifies Ethernet and IP one-way delay network latency
• Confirms frequency, phase, and time synchronisation with near-lab grade accuracy in the field per G.8265.1, G.8275.1 and G.8275.2
• Proves out GNSS antenna installations and faults
• Supports multiple GNSS constellations including GPS, GLONASS, BeiDou, SBAS, and QZSS
• Enable fast and accurate satellite acquisition with a modern 72 channel GNSS receiver
• Supports multiple 1 PPS and 10 Mhz inputs and disciplined outputs
• PTP grand master (PRTC) emulation and Wander Analysis per G.8273.1, G.8273.2
• SyncE Wander Analysis per G.8262
• One-Way-Delay measurements for 1 & 10 GE circuits accurate in nanoseconds