VIAVI SWS2000 Swept Wavelength System

The Swept Wavelength System SWS2000 series remains the industry standard solution for measuring insertion loss (IL), polarisation dependent loss (PDL), return loss (RL) and directivity with high wavelength resolution in both research and development (R&D) and production environments. With the OMNI Expansion group delay (GD) and differential group delay can be added making SWS the ideal system for the complete verification of components for 40G systems.

Currently used at more than 80 customer sites,with over 8500 detector channels deployed, the SWS test platform validates optical performance for the latest in optical components and modules including: ROADMs, Wavelength Switches, Tunable Filters and Circuit Packs. The SWS system consists of a tunable laser source, a source optics module (SOM), a control module, a receiver chassis, one or more detector modules and application software.

With a ± 0.002 nm absolute wavelength accuracy over the entire 1420 to 1630 nm range, a high sweep speed of 40 nm/s, and a deep dynamic range of > 70 dB, the SWS2000 provides excellent performance combined with a low cost of ownership; the distributed architecture supports up to eight separate, individually controlled measurement stations per source laser. Often purchased initially as an R&D tool, this scalability in the number of measurement stations provides customers the flexibility to transition the equipment from R&D to production.

Upgrade packages from legacy SWS systems to the SWS2000 platform are available to ensure that existing SWS users receive the maximum benefit from their existing capital infrastructure.

Safety Information

• Complies to CE requirements plus UL3101.1 and CAN/CSA - C22.2 No. 1010.1. The laser source in the Source Optics Module (SWS20010) is a class 1. The Tunable Laser Source (SWS17101 and SWS18101) is a class 3B laser. Both are classified per IEC standard 60825-1(202) and comply with 21CFR1040.10 except deviations per Laser Notice No. 50, July 2001.

Applications

• Optical component and module characterisation in both R&D and manufacturing environments
  • ROADMs,Wavelength Switches, Wavelength Blockers
  • Circuit Packs
  • Dense wavelength division multiplexing (DWDM), Coarse wavelength division multiplexing (CWDM)
  • Tunable Filters, Couplers, Splitters, Switches, Attenuators, Fiber Bragg Gratings (FBGs), Interleavers, Dichroic Filters
  • Micro-Electro-Mechanical Systems (MEMS) and Waveguide Devices

Key Features

• Scalable architecture - add more stations any time
• ± 0.002 nm absolute wavelength accuracy
• Up to 128 detector channels available per station
• Remote source laser can be shared by up to 8 workstations
• High speed scanning (user controllable) up to 40 nm/s
• Flexible easy-to-use software
• Customized applications through dynamic link libraries (DLLs)
• 24/7 service and support