Keithley 2602

Key Features and Benefits:

• Combines a precision power supply, true current source, DMM, arbitrary waveform generator, V or I pulse generator with measurement, electronic load, and trigger controller-all in one instrument
• Contact check function ensures high integrity measurements
• 10,000 readings/s and 5,500 source-measure points/s to memory provide faster test times
• The embedded Test Script Processor (TSP™) offers unparalleled system automation and two to four times the test throughput of competitive products in I-V functional test applications
• Family of products offers wide dynamic range: 1pA to 10A and 1μV to 200V
• TSP-Link™ master/slave connection seamlessly integrates multiple Series 2600 SourceMeter channels into a system that can be programmed and controlled as a single instrument
• Free Test Script Builder software simplifies creating powerful test scripts for programming custom test functions
• Free LabTracer® 2.0 software available for curve tracing and fast, easy startup
• Each SourceMeter channel is electrically isolated for high integrity measurements and wiring flexibility
• Industry's highest SMU rack density for automated test applications

Series 2600 System SourceMeter instruments offer electronic component and semiconductor device manufacturers a scalable, high throughput, highly cost-effective solution for precision DC, pulse, and low frequency AC source-measure testing. Building on the tightly integrated source-measure technology originally developed for Keithley's popular Series 2400 SourceMeter line, Series 2600 instruments provide from two to four times the test speed of competitive solutions in I-V functional test applications. They also offer higher source-measure channel density and a significantly lower cost of ownership than competing products. The analog-to-digital converters provide simultaneous I and V measurements in less than 100μs (10,000 rdgs/s) and source-measure sweep speeds of less than 200μs per point (5,500 points/s). This high speed source-measure capability, plus advanced automation features and time-saving software tools make Series 2600 SourceMeter instruments an ideal solution for I-V testing of a wide range of devices.

Related Applications:

• I-V functional test and characterisation of a wide range of devices, including:
•     Discrete and passive components
•     Two-leaded – Resistors, disk drive heads, metal oxide varistors (MOVs), diodes, zener diodes, sensors, capacitors, thermistors
•     Three-leaded – Small signal bipolar junction transistors (BJTs), field-effect transistors (FETs), and more
•     Parallel test – Two- and three-leaded component arrays
•     Simple ICs – Optos, drivers, switches, sensors
• Integrated devices – Small Scale Integrated (SSI) and Large Scale Integrated (LSI)
•     Analog ICs
•     Radio frequency integrated circuits (RFICs)
•     Application specific integrated circuits (ASICs)
•     System on a chip (SOC) devices
• Optoelectronic devices such as light-emitting diodes (LEDs), laser diodes, high brightness LEDs (HBLEDs), vertical cavity surface-emitting lasers (VCSELs), displays
• R&D and device characterisation of these types of devices